subjectheading:[Semiconductors -- Failures.] - Search Results - University of Southern Indiana

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Ebook (2)

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2014 (1)
2009 (1)

1.	Electrical overstress (EOS) [electronic resource] : devices, circuits and systems / Steven H. Voldman. Voldman, Steven H. Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014. TK7871.852 .V648 2014eb \| View e-resource \| Available Online \| Detailed record - Similar records
2.	ESD : failure mechanisms and models / Steven H. Voldman. Voldman, Steven H. Chichester, West Sussex, U.K. ; Hoboken, NJ : J. Wiley, 2009. TK7871.852 .V65 2009 \| View e-resource \| Available Online \| Detailed record - Similar records

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