subjectheading:[Metrology.] - Search Results - University of Southern Indiana

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1.	Optical imaging and metrology [electronic resource] : advanced technologies / edited by Wolfgang Osten and Nadya Reingand. Osten, Wolfgang.; Reingand, Nadya. Weinheim, Germany : Wiley-VCH, 2012. QC88 .O68 2012eb \| View e-resource \| Available Online \| Detailed record - Similar records
2.	Models and measures in measurements and monitoring / Vitaliy P. Babak, Serhii V. Babak, Volodymyr S. Eremenko, Yurii V. Kuts, Mykhailo V. Myslovy[...] Babak, Vitaliy P. author.; Babak, Serhii V. author.; Eremenko, Volodymyr S. author.; K[...] Cham, Switzerland : Springer, [2021] T50 \| View e-resource \| Available Online \| Detailed record - Similar records
3.	Measurement across the sciences : developing a shared concept system for measurement / Luca Mari, Mark Wilson and Andrew Maul. Mari, Luca, author.; Wilson, Mark, 1954 August 23- author.; Maul, Andrew, author. Cham, Switzerland : Springer, [2021] ©2021 QC88 \| View e-resource \| Available Online \| Detailed record - Similar records
4.	Terahertz metrology / Mira Naftaly, editor. Naftaly, Mira, editor. Boston ; London : Artech House, [2015] ©2015 QC454.T47 .T473 2015 \| View e-resource \| Available Online \| Detailed record - Similar records
5.	Metrology / Wei Gao, editor. Gao, Wei, editor. Singapore : Springer, 2019. QC88 \| View e-resource \| Available Online \| Detailed record - Similar records
6.	Handbook of surface and nanometrology [electronic resource] / David J. Whitehouse. Whitehouse, D. J. (David J.); Whitehouse, D. J. (David J.). Handbook of surface me[...] Boca Raton, FL : CRC Press, c2011. TA418.7 .W47 2011 \| View e-resource \| Available Online \| Detailed record - Similar records
7.	Quantum metrology : foundation of units and measurements. / Ernst O. Göbel and Uwe Siegner. Göbel, Ernst O., author.; Siegner, Uwe, author. Weinheim, Germany : Wiley-VCH, 2015. ©2015 QC88 .G34 2015 \| View e-resource \| Available Online \| Detailed record - Similar records
8.	Metrology in chemistry / Ewa Bulska. Bulska, Ewa. Cham, Switzerland : Springer, [2018] QC88 \| View e-resource \| Available Online \| Detailed record - Similar records
9.	Evaluating measurement accuracy : a practical approach / Semyon G. Rabinovich. Rabinovich, S. G. Cham : Springer, 2017. T50 \| View e-resource \| Available Online \| Detailed record - Similar records
10.	Metrology and physical constants : proceedings of the International School of Physics "Enrico Fermi", course 185, Varenna on Lake Como,[...] Società italiana di fisica.; Rossi, A. M.; Bava E.; Kühne M. Amsterdam, Netherlands : IOS Press, 2013. ©2013 QC88 .M487 2013eb \| View e-resource \| Available Online \| Detailed record - Similar records

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