Scanning probe microscopy : the lab on a tip / Ernst Meyer, Roland Bennewitz, Hans J. Hug.
Meyer, E. (Ernst), 1962- author.; Hug, Hans J. (Hans Josef), 1964- author.; Bennewitz, Roland, 1967- author.
2021
QH212.S33 M49 2021
Available Online

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Title Scanning probe microscopy : the lab on a tip / Ernst Meyer, Roland Bennewitz, Hans J. Hug.
Author Meyer, E. (Ernst), 1962- author.
Edition Second edition.
ISBN 9783030370893 electronic book
3030370895 electronic book
3030370887
9783030370886
9783030370909 (print)
3030370909
9783030370916 (print)
3030370917
DOI https://doi.org/10.1007/978-3-030-37089-3
Published Cham, Switzerland : Springer, [2021]
Language English
Description 1 online resource (xiv, 322 pages).
Item Number 10.1007/978-3-030-37089-3 doi
Call Number QH212.S33 M49 2021
Dewey Decimal Classification 502.8/25
Summary Written by three leading experts in the field, this book describes and explains all essential aspects of scanning probe microscopy. Emphasis is placed on the experimental design and procedures required to optimize the performance of the various methods described. The book covers not only the physical principles behind this popular technique, but also tackles questions on instrument design, the basic features of the different imaging modes, and recurring artifacts. Novel applications and the latest research results are presented, and the book closes with a look at the future prospects of scanning probe microscopy, while also discussing related techniques in the field of nanoscience. This second edition includes essential scientific updates reflecting the latest research, as well as coverage of new breakthroughs in techniques such as submolecular imaging by atomic force microscopy (AFM), multifrequency AFM, high-speed imaging of biological matter, scanning x-ray microscopy, and tip-enhanced Raman scattering. The book serves as a general, hands-on guide for all types of classes that address scanning probe microscopy. It is ideally suited for graduate and advanced undergraduate students, either for self-study or as a textbook for a dedicated course on the topic. Furthermore, it is an essential component of any scanning probe microscopy laboratory course and a valuable resource for practicing researchers developing and using scanning probe techniques.
Bibliography, etc. Note Includes bibliographical references and index.
Access Note Access limited to authorized users.
Digital File Characteristics text file PDF
Source of Description Description based on online resource; title from digital title page (viewed on June 22, 2021).
Added Author Hug, Hans J. (Hans Josef), 1964- author.
Bennewitz, Roland, 1967- author.
Series Graduate texts in physics.
Available in Other Form Print version: 9783030370886
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Introduction to Scanning Probe Microscopy
Overview
Basic Concepts
Introduction to Scanning Tunneling Microscopy
Tunneling: A Quantum-Mechanical Effect
Instrumental Aspects
Resolution Limits
Observation of Confined Electrons
Spin-Polarized Tunneling
Observation of the Kondo Effect and Quantum Mirage
Force Microscopy
Concept and Instrumental Aspects
Relevant Forces
Operation Modes in Force Microscopy
Contact Force Microscopy
Dynamic Force Microscopy
Tapping Mode Force Microscopy
Further Modes of Force Microscopy
Force Resolution and Thermal Noise
High-speed AFM
Multifrequency AFM
MFM and Related Techniques
MFM Operation Modes
Contrast Formation
Magnetic Resonance Force Microscopy
Other Members of the SPM Family
Artifacts in SPM
Future Aspects of SPM.

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