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RF and time-domain techniques for evaluating novel semiconductor transistors / Keith A. Jenkins.

9783030777753 (electronic bk.)
3030777758 (electronic bk.)
303077774X
9783030777746

Cham, Switzerland : Springer, 2022.

English

1 online resource (xi, 168 pages) : color illustrations.

10.1007/978-3-030-77775-3 doi

TK7871.95

621.3815/284

This book presents a variety of techniques using high-frequency (RF) and time-domain measurements to understand the electrical performance of novel, modern transistors made of materials such as graphene, carbon nanotubes, and silicon-on-insulator, and using new transistor structures. The author explains how to use conventional RF and time- domain measurements to characterize the performance of the transistors. In addition, he explains how novel transistors may be subject to effects such as self-heating, period-dependent output, non-linearity, susceptibility to short-term degradation, DC-invisible structural defects, and a different response to DC and transient inputs. Readers will understand that in order to fully understand and characterize the behavior of a novel transistor, there is an arsenal of dynamic techniques available. In addition to abstract concepts, the reader will learn of practical tips required to achieve meaningful measurements, and will understand the relationship between these measurements and traditional, conventional DC characteristics.

Includes bibliographical references and index.

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text file PDF

Online resource; title from PDF title page (SpringerLink, viewed January 19, 2022).

Print version: 9783030777746

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