Production planning and control in semiconductor manufacturing : big data analytics and Industry 4.0 applications / Tin-Chih Toly Chen.
2023
HD9696.S42
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Details
Title
Production planning and control in semiconductor manufacturing : big data analytics and Industry 4.0 applications / Tin-Chih Toly Chen.
Author
Chen, Tin-Chih Toly, author.
ISBN
9783031140655 (electronic bk.)
3031140656 (electronic bk.)
9783031140648
3031140648
3031140656 (electronic bk.)
9783031140648
3031140648
Published
Cham : Springer, [2023]
Copyright
©2023
Language
English
Description
1 online resource (vi, 100 pages) : illustrations (chiefly color).
Item Number
10.1007/978-3-031-14065-5 doi
Call Number
HD9696.S42
Dewey Decimal Classification
338.4/762138152
Summary
This book systematically analyzes the applicability of big data analytics and Industry 4.0 from the perspective of semiconductor manufacturing management. It reports in real examples and presents case studies as supporting evidence. In recent years, technologies of big data analytics and Industry 4.0 have been frequently applied to the management of semiconductor manufacturing. However, related research results are mostly scattered in various journal issues or conference proceedings, and there is an urgent need for a systematic integration of these results. In addition, many related discussions have placed too much emphasis on the theoretical framework of information systems rather than on the needs of semiconductor manufacturing management. This book addresses these issues.
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed October 4, 2022).
Series
SpringerBriefs in applied sciences and technology. 2191-5318
Available in Other Form
Print version: 9783031140648
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Table of Contents
Chapter 1. Big Data Analytics for Semiconductor Manufacturing
Chapter 2. Industry 4.0 for Semiconductor Manufacturing
Chapter 3. Cycle Time Prediction and Output Projection
Chapter 4. Defect Pattern Analysis, Yield Learning Modeling and Yield Prediction
Chapter 5. Job Sequencing and Scheduling.
Chapter 2. Industry 4.0 for Semiconductor Manufacturing
Chapter 3. Cycle Time Prediction and Output Projection
Chapter 4. Defect Pattern Analysis, Yield Learning Modeling and Yield Prediction
Chapter 5. Job Sequencing and Scheduling.