Radiation effects on integrated circuits and systems for space applications / Raoul Velazco, Dale McMorrow, Jaime Estela, editors.
Velazco, Raoul, editor.; McMorrow, Dale, editor.; Estela, Jaime, editor.
2019
TL3000
Available Online

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Title
Radiation effects on integrated circuits and systems for space applications / Raoul Velazco, Dale McMorrow, Jaime Estela, editors.
ISBN
9783030046606 (electronic book)
3030046605 (electronic book)
9783030046590
3030046591
DOI
https://doi.org/10.1007/978-3-030-04660-6
Published
Cham, Switzerland : Springer, 2019.
Language
English
Description
1 online resource (ix, 401 pages) : illustrations
Item Number
10.1007/978-3-030-04660-6 doi
Call Number
TL3000
Dewey Decimal Classification
629.47
Summary
This book provides readers with invaluable overviews and updates of the most important topics in the radiation-effects field, enabling them to face significant challenges in the quest for the insertion of ever-higher density and higher performance electronic components in satellite systems. Readers will benefit from the up-to-date coverage of the various primary (classical) sub-areas of radiation effects, including the space and terrestrial radiation environments, basic mechanisms of total ionizing dose, digital and analog single-event transients, basic mechanisms of single-event effects, system-level SEE analysis, device-level, circuit-level and system-level hardening approaches, and radiation hardness assurance. Additionally, this book includes in-depth discussions of several newer areas of investigation, and current challenges to the radiation effects community, such as radiation hardening by design, the use of Commercial-Off-The-Shelf (COTS) components in space missions, CubeSats and SmallSats, the use of recent generation FPGA's in space, and new approaches for radiation testing and validation. The authors provide essential background and fundamentals, in addition to information on the most recent advances and challenges in the sub-areas of radiation effects. Provides a concise introduction to the fundamentals of radiation effects, latest research results, and new test methods and procedures; Discusses the radiation effects and mitigation solutions for advanced integrated circuits and systems designed to operate in harsh radiation environments; Includes coverage of the impact of Small Satellites in the space industry.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed April 24, 2019).
Added Author
Velazco, Raoul, editor.
McMorrow, Dale, editor.
Estela, Jaime, editor.
Available in Other Form
Print version: 9783030046590
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Chapter1: Space and Radiation Environments
Chapter2: System-Level Modeling and Analysis fo the Vulnerability of a Processor to SEU
Chapter3: Single Event Effects Test Methods
Chapter4: Characteristics and Applications of Pulsed-Laser-Induced Single-Event Effects
Chapter5: Microprocessor Testing
Chapter6: Fault Injection Methodologies
Chapter7: Mitigation techniques and Error prediction applied in Multicore processors
Chapter8: Improving reliability of multi/many-core processors by using NMR-MPar approach
Chapter9: System Hardening and Real Applications
Chapter10: Backward Error Recovery in SRAM based FPGA
Chapter11: Development of a Hardened 150nm Standard Cell library
Chapter12: COTS in Space: Constraints, Limitations and Disruptive Capability
Chapter13: COTS & the NewSpace
Chapter14: The Phoenix GPS Receiver for Rocket and Satellite Applications
An Example for the Successful Utilization of COTS Technology in Space Projects
Chapter15: Simulation-based Radiation Hardness Assurance for ATHENA-WFI
Chapter16: COTS for Deep Space Missions.

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