Front Matter
One-Shot Device Testing Data
Likelihood Inference
Bayesian Inference
Model Mis-Specification Analysis and Model Selection
Robust Inference
Semi-Parametric Models and Inference
Optimal Design of Tests
Design of Simple Step-Stress Accelerated Life-Tests
Competing-Risks Models
One-Shot Devices with Dependent Components
Conclusions and Future Directions
Derivation of Hi(a, b)
Observed Information Matrix
Non-Identifiable Parameters for SSALTs Under Weibull Distribution
Optimal Design Under Weibull Distributions with Fixed w1
Conditional Expectations for Competing Risks Model Under Exponential Distribution
Kendall's Tau for Frank Copula.