On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / Andrej Rumiantsev.
2019
TK7871.85 .R865 2019
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Details
Title
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / Andrej Rumiantsev.
Author
Rumiantsev, Andrej, author.
ISBN
9788770221122
9788770221115 (e-book)
9788770221115 (e-book)
Published
Gistrup, Denmark ; Delft, Netherlands : River Publishers, [2019]
Copyright
©2019
Language
English
Description
1 online resource (278 pages).
Call Number
TK7871.85 .R865 2019
Dewey Decimal Classification
621.38152
Access Note
Access limited to authorized users.
Source of Description
Description based on print version record.
Series
River Publishers series in electronic materials and devices.
Available in Other Form
On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond.
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