Trace-based post-silicon validation for VLSI circuits [electronic resource] / by Xiao Liu, Qiang Xu.
Liu, Xiao.; Xu, Qiang.
2014
TK7874 .L58 2014eb
Available Online

Linked e-resources

Linked Resource Online Access

Details

Title Trace-based post-silicon validation for VLSI circuits [electronic resource] / by Xiao Liu, Qiang Xu.
Author Liu, Xiao.
ISBN 9783319005331 electronic book
3319005332 electronic book
9783319005324
Publication Details Cham ; New York : Springer, c2014.
Language English
Description 1 online resource.
Call Number TK7874 .L58 2014eb
Dewey Decimal Classification 621.39/5
Summary This book first provides a comprehensive coverage of state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits.
Bibliography, etc. Note Includes bibliographical references and index.
Access Note Access limited to authorized users.
Added Author Xu, Qiang.
Series Lecture notes in electrical engineering ; v.252.
Linked Resources Online Access
Record Appears in Online Resources > Ebooks
All Resources
1. Introduction
2. State of the art on post-silicon validation
3. Signal selection for visibility enhancement
4. Multiplexed tracing for design error
5. Tracing for electrical Error
6. Reusing test access mechanisms
7. Interconnection fabric for flexible tracing
8. Interconnection fabric for systematic tracing
9. Conclusion.

Browse Subjects

Show more subjects...

Statistics

from
to
Export