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Table of Contents
1. Introduction
2. State of the art on post-silicon validation
3. Signal selection for visibility enhancement
4. Multiplexed tracing for design error
5. Tracing for electrical Error
6. Reusing test access mechanisms
7. Interconnection fabric for flexible tracing
8. Interconnection fabric for systematic tracing
9. Conclusion.
2. State of the art on post-silicon validation
3. Signal selection for visibility enhancement
4. Multiplexed tracing for design error
5. Tracing for electrical Error
6. Reusing test access mechanisms
7. Interconnection fabric for flexible tracing
8. Interconnection fabric for systematic tracing
9. Conclusion.