Scanning probe microscopy [electronic resource] : atomic force microscopy and scanning tunneling microscopy / Bert Voigtländer.
Voigtländer, Bert, author.
2015
QH212.S33 V65 2015eb
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Title
Scanning probe microscopy [electronic resource] : atomic force microscopy and scanning tunneling microscopy / Bert Voigtländer.
Author
Voigtländer, Bert, author.
ISBN
9783662452400 electronic book
3662452405 electronic book
9783662452394
DOI
https://doi.org/10.1007/978-3-662-45240-0
Published
Heidelberg : Springer, [2015]
Copyright
©2015
Language
English
Description
1 online resource : illustrations.
Item Number
10.1007/978-3-662-45240-0 doi
Call Number
QH212.S33 V65 2015eb
Dewey Decimal Classification
502.82
Summary
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Description based on online resource; title from PDF title page (viewed March 4, 2015).
Series
Nanoscience and technology.
Available in Other Form
Print version: 9783662452394
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Introduction
Harmonic Oscillator
Technical Aspects of Scanning Probe Microscopy
Scanning Probe Microscopy Designs
Electronics for Scanning Probe Microscopy
Lock-In Technique
Data Representation and Image Processing
Artifacts in SPM
Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy
Surface States
Forces Between Tip and Sample
Technical Aspects of Atomic force Microscopy (AFM)
Static Atomic Force Microscopy
Amplitude Modulation (AM) Mode in Dynamic Atomic Force Microscopy
Intermittent Contact Mode/Tapping Mode
Mapping of Mechanical Properties Using Force-Distance Curves
Frequency Modulation (FM) Mode in Dynamic Atomic Force Microscopy
Noise in Atomic Force Microscopy
Quartz Sensors in Atomic force Microscopy
Scanning Tunneling Microscopy
Scanning Tunneling Spectroscopy (STS)
Vibrational Spectroscopy with the STM
Spectroscopy and Imaging of Surface States
Building Nanostructures Atom by Atom.

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