Fringe pattern analysis for optical metrology [electronic resource] : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
2014
QC415 .S478 2014eb
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Details
Title
Fringe pattern analysis for optical metrology [electronic resource] : theory, algorithms, and applications / Manuel Servin, J. Antonio Quiroga, and J. Moises Padilla.
Author
Servín, Manuel, author.
ISBN
9783527411528
9783527681082 electronic book
9783527681105 (ePub)
9783527681099 (Mobi)
9783527681075 (oBook)
9783527681082 electronic book
9783527681105 (ePub)
9783527681099 (Mobi)
9783527681075 (oBook)
Published
Weinheim, Germany : Wiley-VCH Verlag GmbH & Co. KGaA, 2014.
Copyright
©2014
Language
English
Description
1 online resource (345 pages) : illustrations
Call Number
QC415 .S478 2014eb
Dewey Decimal Classification
621.36
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Source of Description
Description based on online resource; title from PDF title page (ebrary, viewed June 19, 2014).
Available in Other Form
Fringe pattern analysis for optical metrology : theory, algorithms, and applications.
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