CMOS RF circuit design for reliability and variability [electronic resource] / Jiann-Shiun Yuan.
Yuan, J. S., author.
2016
TK7874.78
Available Online

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Title CMOS RF circuit design for reliability and variability [electronic resource] / Jiann-Shiun Yuan.
Author Yuan, J. S., author.
ISBN 9789811008849 (electronic book)
9811008841 (electronic book)
9789811008825
DOI https://doi.org/10.1007/978-981-10-0884-9
Published Singapore : Springer, 2016.
Language English
Description 1 online resource (vi, 106 pages) : illustrations.
Item Number 10.1007/978-981-10-0884-9 doi
Call Number TK7874.78
Dewey Decimal Classification 621.3815
Summary The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.
Bibliography, etc. Note Includes bibliographical references.
Access Note Access limited to authorized users.
Source of Description Online resource; title from PDF title page (SpringerLink, viewed April 19, 2016).
Series SpringerBriefs in applied sciences and technology. Reliability.
Available in Other Form Print version: 9789811008825
Linked Resources Online Access
Record Appears in Online Resources > Ebooks
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