Metrology and physical mechanisms in new generation ionic devices [electronic resource] / Umberto Celano.
Celano, Umberto, author.
2016
QC176.83
Available Online

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Title
Metrology and physical mechanisms in new generation ionic devices [electronic resource] / Umberto Celano.
Author
Celano, Umberto, author.
ISBN
9783319395319 (electronic book)
3319395319 (electronic book)
9783319395302
Published
Switzerland : Springer, 2016.
Language
English
Description
1 online resource (xxiv, 175 pages) : illustrations.
Call Number
QC176.83
Dewey Decimal Classification
621.3815/2
Summary
The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed. .
Note
"Doctoral thesis accepted by the KU Leuven and IMEC, Belgium."
Bibliography, etc. Note
Includes bibliographical references.
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Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed June 28, 2016).
Series
Springer theses.
Available in Other Form
Metrology and physical mechanisms in new generation ionic devices : Doctoral Thesis accepted by the KU Leuven and IMEC, Belgium.
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Introduction
Filamentary-Based Resistive Switching
Nanoscaled Electrical Characterization
Conductive Filaments: Formation, Observation and Manipulation
Three-Dimensional Filament Observation
Reliability Threats in CBRAM
Conclusions and Outlook. .

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