VLSI-SoC : design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers / Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis (eds.).
2016
QA76.9.C643
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Title
VLSI-SoC : design for reliability, security, and low power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised selected papers / Youngsoo Shin, Chi Ying Tsui, Jae-Joon Kim, Kiyoung Choi, Ricardo Reis (eds.).
Meeting Name
IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration (23rd : 2015 : Taejŏn-si, Korea)
ISBN
9783319460970 (electronic book)
3319460978 (electronic book)
9783319460963
3319460978 (electronic book)
9783319460963
Published
Switzerland : Springer, 2016.
Language
English
Description
1 online resource (xiii, 223 pages) : illustrations.
Item Number
10.1007/978-3-319-46097-0 doi
Call Number
QA76.9.C643
Dewey Decimal Classification
004.6
Summary
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
Note
Includes author index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed September 26, 2016).
Added Author
Shin, Youngsoo, editor.
Tsui, Chi-Ying, editor.
Kim, Jae-Joon, editor.
Choi, Kiyoung, editor.
Reis, Ricardo, editor.
Tsui, Chi-Ying, editor.
Kim, Jae-Joon, editor.
Choi, Kiyoung, editor.
Reis, Ricardo, editor.
Series
IFIP advances in information and communication technology ; 483.
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