VLSI design and test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers / S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
2019
TK7874.75
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Title
VLSI design and test : 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised selected papers / S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh (eds.).
Meeting Name
VDAT (Symposium) (22nd : 2018 : Madurai, India)
ISBN
9789811359507 (electronic book)
9811359504 (electronic book)
9789811359491
9811359504 (electronic book)
9789811359491
Published
Singapore : Springer, 2019.
Language
English
Description
1 online resource (xviii, 722 pages) : illustrations.
Item Number
10.1007/978-981-13-5950-7 doi
Call Number
TK7874.75
Dewey Decimal Classification
621.39/5
Note
Includes author index.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed January 29, 2019).
Added Author
Rajaram, S., 1973- editor.
Balamurugan, N. B. editor.
Gracia Nirmala Rani, D. editor.
Singh, Virendra (Associate professor of electrical engineering), editor.
Balamurugan, N. B. editor.
Gracia Nirmala Rani, D. editor.
Singh, Virendra (Associate professor of electrical engineering), editor.
Series
Communications in computer and information science ; 892.
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