Microstructural characterisation techniques / Gunturi Venkata Sitarama Sastry.
2022
TA407
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Details
Title
Microstructural characterisation techniques / Gunturi Venkata Sitarama Sastry.
ISBN
9789811935091 (electronic bk.)
9811935092 (electronic bk.)
9811935084
9789811935084
9811935092 (electronic bk.)
9811935084
9789811935084
Publication Details
Singapore : Springer, 2022.
Language
English
Description
1 online resource (254 p.).
Item Number
10.1007/978-981-19-3509-1 doi
Call Number
TA407
Dewey Decimal Classification
620.1/1299
Summary
This textbook is aimed at graduate and upper undergraduate students studying materials science and metallurgy. It comprehensively covers the topic of microstructural characterization and includes an emphasis on Fourier analysis and Fourier transformation, electron diffraction, electromagnetic waves and electron waves, lens parameters, transmission electron microscopy, optical microscopy and scanning electron microscopy. The author has included pedagogical features such as end-of-chapter exercises and worked examples with varying degrees of difficulty to augment learning and self-testing. This book will be a useful guide for upper undergraduate and graduate students along with researchers and professionals working in the field of microstructural characterization.
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users.
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed September 27, 2022).
Series
Indian Institute of Metals series.
Available in Other Form
Microstructural Characterisation Techniques
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Table of Contents
Introduction
Electromagnetic Waves and Electron Waves
Fourier Analysis and Fourier Transformation
Transmission Electron Microscope
Electron Diffraction
Optical Microscopy
Transmission Electron Microscopy
Lens-less Electron Microscopy.
Electromagnetic Waves and Electron Waves
Fourier Analysis and Fourier Transformation
Transmission Electron Microscope
Electron Diffraction
Optical Microscopy
Transmission Electron Microscopy
Lens-less Electron Microscopy.