Thin films : processes and characterization techniques / Nicoleta Nedelcu.
2023
TA418.9.T45 N44 2023
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Details
Title
Thin films : processes and characterization techniques / Nicoleta Nedelcu.
Author
Nedelcu, Nicoleta, author.
ISBN
9783031066160 electronic book
3031066162 electronic book
9783031066153
3031066154
3031066162 electronic book
9783031066153
3031066154
Published
Cham, Switzerland : Springer, 2023.
Language
English
Description
1 online resource (1 volume) : illustrations (colour).
Other Standard Identifiers
10.1007/978-3-031-06616-0 doi
Call Number
TA418.9.T45 N44 2023
Dewey Decimal Classification
621.3815/2
Summary
The book provides research scientists and engineers in industry information and data on the materials processing, characterization, and determination of materials physical-chemical properties. The book highlights optical and chemical properties obtained on novel materials using a range of deposition methods by two different spectroscopic techniques: SE and UV-VIS-NIR. Emphasizing applications from across a number of domains including Healthcare, Opto-Electronic, and Defense, the book is ideal for academic researchers, graduate/undergraduate students, and practicing engineers concerned with optical coating technologies. Describes creation of new materials thermal evaporation, sputtering, electrochemical and chemical-vacuum deposition; Explains a technology for material evaporation, uniformity calculation, thickness measurement and layer characterization; Highlights the correlation of optical and chemical properties obtained from spectroscopic methods.
Bibliography, etc. Note
Includes bibliographical references and index.
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Access limited to authorized users.
Source of Description
Description based on online resource; title from digital title page (viewed on May 09, 2023).
Available in Other Form
Thin films.
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Table of Contents
Chapter 1. Introduction
Chapter 2. Thin layer method
Chapter 3. Vacuum thin film deposition installation
Chapter 4. Method for characterizing thin layer
Chapter 5. Study of optical and chemical properties.
Chapter 2. Thin layer method
Chapter 3. Vacuum thin film deposition installation
Chapter 4. Method for characterizing thin layer
Chapter 5. Study of optical and chemical properties.