System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
2008
TK7895.E42 S978 2008eb
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Details
Title
System-on-chip test architectures [electronic resource] : nanometer design for testability / edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba.
ISBN
9780123739735 (hardcover : alk. paper)
012373973X (hardcover : alk. paper)
012373973X (hardcover : alk. paper)
Publication Details
Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Language
English
Description
xxxvi, 856 p. : ill. ; 25 cm.
Call Number
TK7895.E42 S978 2008eb
Dewey Decimal Classification
621.39/5
Bibliography, etc. Note
Includes bibliographical references and index.
Access Note
Access limited to authorized users.
Added Author
Wang, Laung-Terng.
Stroud, Charles E.
Touba, Nur A.
Stroud, Charles E.
Touba, Nur A.
Series
Morgan Kaufmann series in systems on silicon.
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