Field emission scanning electron microscopy : new perspectives for materials characterization / Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
2018
TA417.23
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Can lend chapters, not whole ebooks
Details
Title
Field emission scanning electron microscopy : new perspectives for materials characterization / Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
Author
Brodusch, Nicolas, author.
ISBN
9789811044335 (electronic book)
9811044333 (electronic book)
9789811044328
9811044333 (electronic book)
9789811044328
Published
Singapore : Springer, [2018].
Language
English
Description
1 online resource.
Item Number
10.1007/978-981-10-4433-5 doi
Call Number
TA417.23
Dewey Decimal Classification
502.8/25
Summary
This book highlights what is now achievable in terms of materials characterization with the new generation of cold-field emission scanning electron microscopes applied to real materials at high spatial resolution. It discusses advanced scanning electron microscopes/scanning- transmission electron microscopes (SEM/STEM), simulation and post-processing techniques at high spatial resolution in the fields of nanomaterials, metallurgy, geology, and more. These microscopes now offer improved performance at very low landing voltage and high -beam probe current stability, combined with a routine transmission mode capability that can compete with the (scanning-) transmission electron microscopes (STEM/-TEM) historically run at higher beam accelerating voltage.
Bibliography, etc. Note
Includes bibliographical references.
Access Note
Access limited to authorized users.
Digital File Characteristics
text file PDF
Source of Description
Online resource; title from PDF title page (SpringerLink, viewed October 6, 2017).
Added Author
Demers, Hendrix, author.
Gauvin, Raynald, author.
Gauvin, Raynald, author.
Series
SpringerBriefs in applied sciences and technology.
Available in Other Form
Print version: 9789811044328
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Online Access
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